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Does the ZEISS CONTURA G2 support scanning and touch-trigger measurement?

Yes, the ZEISS CONTURA G2 supports both scanning and touch-trigger measurement, making it an advanced and flexible solution for high-precision applications, including nanotechnology and micro-manufacturing industries.

For scanning, the CONTURA G2 is compatible with ZEISS’s VAST XXT scanning sensor, which enables continuous contact measurement along surfaces. This is ideal for capturing complex geometries and freeform shapes with high accuracy and speed. Scanning is particularly useful in nanotechnology applications where surface profile accuracy and dimensional consistency at micro-scale levels are critical.

On the other hand, the system also supports touch-trigger probes, such as the RDS articulating probe holder paired with TP20 or TP200 sensors. This mode is highly efficient for point-to-point measurements, best suited for checking discrete features like holes, edges, and specific reference points — all with repeatable precision.

The ZEISS CONTURA G2 allows quick switching between scanning and touch-trigger modes, offering unmatched versatility on a single platform. This dual capability is beneficial in nano-scale production, where different parts may require a mix of tactile probing strategies.

Thanks to its advanced multi-sensor interface and CALYPSO software integration, the CONTURA G2 ensures that both measurement modes deliver high repeatability and traceability — essential for quality assurance in precision engineering, optics, medical device manufacturing, and semiconductor component inspection.

In summary, the ZEISS CONTURA G2’s support for both scanning and touch-trigger methods provides the flexibility and accuracy required in nanotechnology-driven environments, reducing inspection time while enhancing data integrity and product quality.